Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections...

This edited book tells the story of the multifaceted efforts devoted by a "e;future school&qu...

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigr...

This book discusses the application of quality and reliability engineering in Asian industries, a...

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where t...

Copper (Cu) has been used as an interconnection material in the semiconductor industry for years ...

Copper (Cu) has been used as an interconnection material in the semiconductor industry for years ...

Reliability and Failure Analysis of High-Power LED Packaging provides fundamental understanding o...

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections...

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where t...

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections...