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  1. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
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    Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
    Brandon Noia
    Springer International Publishing
    Ebook
    Sofort lieferbar

    This book describes innovative techniques to address the testing needs of 3D stacked integrated c...

    Unser bisheriger Preis:ORGPRICE: 112,84 €

    Jetzt 96,29 €Ebook
    Alle Preise inkl. MwSt
  2. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
    Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
    Krishnendu Chakrabarty
    Springer International Publishing, Springer International Publishing
    Buch
    Print on Demand

    This book describes innovative techniques to address the testing needs of 3D stacked integrated c...

    106,99 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
  3. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
    Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
    Krishnendu Chakrabarty
    Springer International Publishing, Springer International Publishing
    Taschenbuch
    Print on Demand

    This book describes innovative techniques to address the testing needs of 3D stacked integrated c...

    109,99 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
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